334 Intermediate EE (call # 01546)

1:10-2:00 Stocker 107

Professors: Dr. Robert Curtis and Dr. Janusz Starzyk Winter Quarter, 2000

Text
C. Jaeger, Microelectronic Circuit Design (Introduction to Electronics)
McGraw Hill 1996.

Reference
 Roger Thomas Howe, Charles Sodini (Contributor), Microelectronics : An Integrated Approach (Prentice Hall Electronic and Vlsi Series), 1996.

Course outline
Introduction to Microelectronics.
        Introduction. Signals, notation.
Semiconductor Physics and IC Technology.
        Pure Semiconductors. Generation, Recombination, and Thermal Equilibrium. Doping.
        Carrier Transport. Silicon Integrated Circuit Technology.
pn Junction and MOS Electrostatics.
        Applied Electrostatics. Carrier Concentration and Potential in Thermal Equilibrium.
        The PN Junction in Thermal Equilibrium. The PN Junction Under Reverse Bias.
        Depletion Capacitance.
The pn Junction Diode.
        pn Diode Circuit Symbol and Terminal Characteristics. Integrated Circuit pn Diodes.
        The pn Junction Diode: A First Pass. pn Junction Diode Circuit Models. SPICE Model
        of the pn Junction Diode. Device Physics of the pn Junction Diode: Non-Equilibrium
        Minority Carrier Recombination. The Continuity Equation.  Diode Applications.
 The MOS Field-Effect Transistor.
        Introduction. Device Physics of MOSFET: Drain Current and Channel Charge.
        MOSFET Device Physics: A First Pass. MOSFET Device Physics: the Gradual
        Channel Approximation. MOSFET Circuit Models. Level I DC Model 35.
The Bipolar Junction Transistor.
        Introduction. Bipolar Junction Transistor Physics: A First Pass. Reverse Active and
        Saturation Operating Regions. The Ebers-Moll Equations. Small-Signal Model of the
        npn BJT. BJT Device Physics. Lateral pnp Bipolar Transistor. SPICE Models for
        Bipolar Junction Transistors.
Single-State Bipolar/MOS Transistor Amplifiers.
        General Amplifier Concepts. Common-Emitter Amplifier-Introduction.
        Common-Source Amplifier-Introduction. Current Source Supplies. Common-Source
        Amplifier with Current Source Supply. Common-Emitter Amplifier with Current
        Source Supply. Improved Transconductance Amplifier with Emitter Degeneracy
        Resistor. Common-Base/Gate Amplifier.
 

Office hours and contact information

Dr. Starzyk - Tuesday and Thursday 2-3 p.m.; other hours by appointment.
starzyk@bobcat.ent.ohiou.edu    http://www.ent.ohiou.edu/~starzyk
Office location - Stocker 347.

Dr. Curtis - Monday, Wednesday, and Friday 11 a.m. -12 p.m.
rcurtis@bobcat.ent.ohiou.edu    http://www.ent.ohiou.edu/~rcurtis
Office location - Stocker 313.

Grading

Grades will be based on the following;

  • Homework (25%)
  • Computer work (15%)
  • Midterm examinations (30%)
  • Final examination (30%)

  • Each homework problem is worth 1 point. Full credit is given even if the answer is wrong. If the work is not complete, or if only a small part of the problem was attempted, the grade will be 1/2 or 0 based on how much is handed in. Grading of computer problems is similar, except that the maximum grade is up to 5 points, and these ARE graded on merit.
    The total grade is the sum of homework and computer points, THE BEST midterm, and the final exam.   This score is compared with other students' scores, and a letter grade is assigned. Note that neglecting the homework can lower your grade a great deal!

    Examinations

  • Midterm I - Feb. 3, 2000.
  • Midterm II - Feb. 24, 2000.
  • Final examination - March 16, 2000, 2:30, p.m.

  • All examinations are closed books and notes. Students may have one sheet with formulas as a help during each exam.  No make-ups are allowed for tests except in accordance with University policy for excused absences.

    Withdrawal

    A student may withdraw from class at his discretion up to and including the first 21 days of the quarter.

    Academic Conduct

    Cheating on examinations, submitting work of other students as your own, or plagiarism in any form will result in penalties ranging from an F on the assignment or exam to expulsion from the university, depending on the seriousness of the offense.